Widefield Raman polarization structured illumination super-resolution microscopy

Chuwen Zhou; Chonglei Zhang

doi:10.1117/12.3041259

26 September 2024 Widefield Raman polarization structured illumination super-resolution microscopy

Chuwen Zhou, Chonglei Zhang

Proceedings Volume 13282, Second Advanced Imaging and Information Processing Conference (AIIP 2024); 1328206 (2024) https://doi.org/10.1117/12.3041259
Event: Second Advanced Imaging and Information Processing Conference (AIIP 2024), 2024, Xining, China

Abstract

The continuous development of two-dimensional materials has put forward a higher demand for instrument detection performance, in which Raman polarization is an important reference to judge the optical properties of materials, but the existing Raman polarization detection cannot detect the super-resolution spatial distribution information. In this paper, a wide-field Raman polarized structured illuminated super resolution microscope is proposed. Based on SIM model and tunable filter, wide-field Raman signal could be acquired. According to the characteristics of low signal-to-noise ratio of Raman scatting, HiFi SIM and pSIM are combined to reduce the reconstruction artifacts and realize the demodulation of Raman polarization super-resolution images effectively and correctly. We successfully realized the G-band imaging of 100𝑛𝑛𝑛𝑛 single-walled carbon nanotubes based on this system and algorithm, which verified the correctness of the polarization calculation of the system.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Chuwen Zhou and Chonglei Zhang "Widefield Raman polarization structured illumination super-resolution microscopy", Proc. SPIE 13282, Second Advanced Imaging and Information Processing Conference (AIIP 2024), 1328206 (26 September 2024); https://doi.org/10.1117/12.3041259

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