Beryllium scatter analysis program

Jerry L. Behlau; Edward M. Granger; John J. Hannon; Mark Baumler; James F. Reilly

doi:10.1117/12.50511

1 December 1991 Beryllium scatter analysis program

Jerry L. Behlau, Edward M. Granger, John J. Hannon, Mark Baumler, James F. Reilly

Proceedings Volume 1530, Optical Scatter: Applications, Measurement, and Theory; (1991) https://doi.org/10.1117/12.50511
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Many groups today are researching the characteristics of beryllium, in an attempt to find ways of producing high quality (low scatter) stable beryllium optics. This paper discusses a two-part study in which (1) an attempt is being made to determine the best, raw beryllium mixture and preparation, machining and polishing processes, test and analysis methods, and (2) a proposed model for the prediction of scatter from beryllium surfaces (based on a knowledge of surface and subsurface interactions with incident wavelengths) will be refined against empirical data. We discuss design of the experiment, the model, and some of the early results.

Citation Download Citation

Jerry L. Behlau, Edward M. Granger, John J. Hannon, Mark Baumler, and James F. Reilly "Beryllium scatter analysis program", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50511

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available