Mapping of imbedded contaminants in transparent material by optical scatter

Donald A. Rudberg; John C. Stover; Douglas E. McGary

doi:10.1117/12.50512

1 December 1991 Mapping of imbedded contaminants in transparent material by optical scatter

Donald A. Rudberg, John C. Stover, Douglas E. McGary

Proceedings Volume 1530, Optical Scatter: Applications, Measurement, and Theory; (1991) https://doi.org/10.1117/12.50512
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The paper reviews the design of an instrument designed to detect and map internal defects found in PMMA plastic. The material is used to manufacture intraocular lenses and must be free of defects larger than about 20 micrometers for a variety of safety, manufacturing and cosmetic reasons. The instrument detects scatter from a diode with a CCD array camera to map defect location. This information is used to avoid manufacturing lenses that will eventually be rejected.

Citation Download Citation

Donald A. Rudberg, John C. Stover, and Douglas E. McGary "Mapping of imbedded contaminants in transparent material by optical scatter", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50512

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