New method of fringe pattern trace and analysis

Guiying Wang; Aiming Sun; Jun Ren; ZhiJiang Wang

doi:10.1117/12.139903

24 August 1992 New method of fringe pattern trace and analysis

Guiying Wang, Aiming Sun, Jun Ren, ZhiJiang Wang

Proceedings Volume 1704, Advances in Optical Information Processing V; (1992) https://doi.org/10.1117/12.139903
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

Centroid and geometric center methods are suggested for tracing the center location of an irregular interferogram in this paper. The methods remove limitations of general software which may only analyze straight or quasi-straight fringe patterns. The F-test method is used to control accuracy of fringe analysis. The speed and accuracy of the software depend upon the quality of the fringe pattern and a number of sample points.

Citation Download Citation

Guiying Wang, Aiming Sun, Jun Ren, and ZhiJiang Wang "New method of fringe pattern trace and analysis", Proc. SPIE 1704, Advances in Optical Information Processing V, (24 August 1992); https://doi.org/10.1117/12.139903

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