Manufacturing, metrology, and assembly of the mirror system for the CDS-EM

Udo Dinger; T. Petasch; C. Wolfgang Kuebler; A. Ebert; Klaus-Friedrich Beckstette

doi:10.1117/12.140585

21 January 1993 Manufacturing, metrology, and assembly of the mirror system for the CDS-EM

Udo Dinger, T. Petasch, C. Wolfgang Kuebler, A. Ebert, Klaus-Friedrich Beckstette

Proceedings Volume 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography; (1993) https://doi.org/10.1117/12.140585
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Attention is given to the Coronal Diagnostic Spectrometer (CDS), one of the key instruments on the ESA-cornerstone mission SOHO, scheduled for launch in 1995. It is designed to study the solar corona in the EUV. The on-axis resolution of the system is specified to 2 arcsec half-energy-width, which sets very stringent limits on the figuring and alignment tolerances. From the mechanical measurements and the optical tests a system HEW of 3.3 arcsec at EUV wavelengths is predicted. The HEW at 633 nm, including diffraction, is 2.2 arcsec. A performance comparable to ROSAT was achieved on the CDS mirrors which, due to the much higher asphericity, are at least 20 times more difficult to manufacture. Assembly techniques have been developed which allowed the high accurate alignment of the type II telescope, which is much more sensitive to misalignments than type I telescopes of comparable focal length and required correcting mirror displacements of as little as 20 nm while ensuring sufficient stiffness during glueing.

Citation Download Citation

Udo Dinger, T. Petasch, C. Wolfgang Kuebler, A. Ebert, and Klaus-Friedrich Beckstette "Manufacturing, metrology, and assembly of the mirror system for the CDS-EM", Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); https://doi.org/10.1117/12.140585

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