Retroreflections on a low-tech approach to the measurement of         opposition effect

Tod F. Schiff; John C. Stover; Daniel J. Wilson; B. D. Swimley; Mark E. Southwood; Donald R. Bjork

doi:10.1117/12.140707

12 February 1993 Retroreflections on a low-tech approach to the measurement of opposition effect

Tod F. Schiff, John C. Stover, Daniel J. Wilson, B. D. Swimley, Mark E. Southwood, Donald R. Bjork

Proceedings Volume 1753, Stray Radiation in Optical Systems II; (1993) https://doi.org/10.1117/12.140707
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

This paper reviews a simple (economical) technique for measuring retro-scatter. Noise floors below 10^-5 sr^-1 have been achieved. The technique relies on a unique Stokes/Mueller method of characterizing sample polarization characteristics. Data is presented for several samples. This paper relies on material presented in the preceding two papers of this document.

Citation Download Citation

Tod F. Schiff, John C. Stover, Daniel J. Wilson, B. D. Swimley, Mark E. Southwood, and Donald R. Bjork "Retroreflections on a low-tech approach to the measurement of opposition effect", Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); https://doi.org/10.1117/12.140707

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