Issues in the design of systems incorporating electron bombarded CCDs

Alice L. Reinheimer

doi:10.1117/12.148610

12 July 1993 Issues in the design of systems incorporating electron bombarded CCDs

Alice L. Reinheimer

Proceedings Volume 1900, Charge-Coupled Devices and Solid State Optical Sensors III; (1993) https://doi.org/10.1117/12.148610
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States

Abstract

Single electron detection is desirable in systems incorporating EBCCDs. The sources of noise in single electron counting are discussed and an expression is given for the total noise.

Citation Download Citation

Alice L. Reinheimer "Issues in the design of systems incorporating electron bombarded CCDs", Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); https://doi.org/10.1117/12.148610

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