Paper
13 August 1993 Ion-assisted deposition of oxide films
Hedva Zipin, Orna Marcovitch, Y. Refaeli, Yigal Yadin, Zeev Klein
Author Affiliations +
Abstract
Various oxide films were prepared by oxygen ion-assisted deposition. The ion source (Mark II Gridless Ion source, manufactured by Commonwealth Scientific Corp.) uses the End-Hall configuration and generates high-current, low-energy beams of ions. Films of TiO2, SiO2, Al2O3, Y2O3 were deposited on substrates in temperatures ranging from ambient to 200 degree(s)C. The films had a high index of refraction, were hard and adhered strongly to the substrates, as compared to conventionally deposited oxide films. Multilayers of TiO2/SiO2 were prepared giving hard and environmentally stable coatings.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hedva Zipin, Orna Marcovitch, Y. Refaeli, Yigal Yadin, and Zeev Klein "Ion-assisted deposition of oxide films", Proc. SPIE 1972, 8th Meeting on Optical Engineering in Israel: Optoelectronics and Applications in Industry and Medicine, (13 August 1993); https://doi.org/10.1117/12.151104
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KEYWORDS
Ions

Oxides

Manufacturing

Multilayers

Oxygen

Refraction

Aluminum

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