Fourier transform infrared study of surface and interface processes of curing films using specular reflectance and ATR

Michael Claybourn

doi:10.1117/12.166759

31 January 1994 Fourier transform infrared study of surface and interface processes of curing films using specular reflectance and ATR

Michael Claybourn

Author Affiliations +

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166759
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

The chemical behavior at the air/film and substrate film interface has been characterized for a commercial polyurethane crosslinked coating system. The techniques used were specular reflectance (air/film interface) and ATR (substrate/film interface). The top surface followed second order kinetics whereas the back interface showed a reaction rate governed by the increasing crosslink density. A comparison of the behavior at each interface was made.

Citation Download Citation

Michael Claybourn "Fourier transform infrared study of surface and interface processes of curing films using specular reflectance and ATR", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166759

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available