Paper
22 September 1993 Electrical impedance imaging for prediction of interfacial area density in two-phase flow
O. C. Jones, M. Kemal Kiymik, H. Riza Ozcalik, Jen Tai Lin
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156476
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
Work described in this paper represents the progress toward the development of electrical impedance imaging (Eli) sometimes called electrical computed tomography (EICT) which may ultimately be utilized for nonintrusive determination of interfecial structure and evolution in two phase flows.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. C. Jones, M. Kemal Kiymik, H. Riza Ozcalik, and Jen Tai Lin "Electrical impedance imaging for prediction of interfacial area density in two-phase flow", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156476
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Chemical elements

Finite element methods

Electrodes

Inverse problems

Liquids

Algorithm development

Light scattering

Back to Top