Ultrafast scanning probe microscopy

David Botkin; Shimon Weiss; D. Frank Ogletree; Miguel Salmeron; Daniel S. Chemla

doi:10.1117/12.175874

16 May 1994 Ultrafast scanning probe microscopy

David Botkin, Shimon Weiss, D. Frank Ogletree, Miguel Salmeron, Daniel S. Chemla

Proceedings Volume 2116, Generation, Amplification, and Measurement of Ultrashort Laser Pulses; (1994) https://doi.org/10.1117/12.175874
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

We have developed a general technique that combines the temporal resolution of ultrafast laser spectroscopy with the spatial resolution of scanned probe microscopy (SPM). Using this technique with scanning tunneling microscopy (STM), we have obtained simultaneous 2 ps time resolution and 50 angstrom spatial resolution. This improves the time resolution currently attainable with STM by nine orders of magnitude. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution is discussed.

Citation Download Citation

David Botkin, Shimon Weiss, D. Frank Ogletree, Miguel Salmeron, and Daniel S. Chemla "Ultrafast scanning probe microscopy", Proc. SPIE 2116, Generation, Amplification, and Measurement of Ultrashort Laser Pulses, (16 May 1994); https://doi.org/10.1117/12.175874

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