Advances and Applications of Electronic Speckle Pattern Interferometry (ESPI)

Ole J. Lokberg

doi:10.1117/12.958425

14 May 1980 Advances and Applications of Electronic Speckle Pattern Interferometry (ESPI)

Ole J. Lokberg

Proceedings Volume 0215, Recent Advances in Holography; (1980) https://doi.org/10.1117/12.958425
Event: 1980 Los Angeles Technical Symposium, 1980, Los Angeles, United States

Abstract

The principle of Electronic Speckle Pattern Interferometry - ESPI - is explained by comparing it to image holography where recording and reconstruction are performed by videotechniques. As such, ESPI can be used for different interferometric measurements, but it is especially suitable for vibration testing and measurement of movements. Our work on extending the measuring range and general use of ESPI for those purposes is described and illustrated by some practical applications.

Citation Download Citation

Ole J. Lokberg "Advances and Applications of Electronic Speckle Pattern Interferometry (ESPI)", Proc. SPIE 0215, Recent Advances in Holography, (14 May 1980); https://doi.org/10.1117/12.958425

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