Antireflection coatings on 1.55 um LiNbO3 guided-wave devices using sputtered SiO2/Y2O3 and SiO2/TiO2 bilayers

C. Ramus; F. Huet; Jean Saulnier

doi:10.1117/12.192165

4 November 1994 Antireflection coatings on 1.55-μm LiNbO₃ guided-wave devices using sputtered SiO₂/Y₂O₃ and SiO₂/TiO₂ bilayers

C. Ramus, F. Huet, Jean Saulnier

Author Affiliations +

Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192165
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France

Abstract

Two anti-reflection coatings processes, based on RF magnetron sputtering, have been used to reduce the reflectance of Ti:LiNbO₃ optical waveguide/fiber interface. Measurements show typical reflectance values around -25 dB and -30 dB, at 1.55 micrometers , using respectively SiO₂/Y₂O₃ and SiO₂/TiO₂ bilayers.

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C. Ramus, F. Huet, and Jean Saulnier "Antireflection coatings on 1.55-μm LiNbO₃ guided-wave devices using sputtered SiO₂/Y₂O₃ and SiO₂/TiO₂ bilayers", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192165

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