Refractometry using resonance shifts in fiber to metal clad planar waveguide couplers

V. Kutsaenko; Walter Johnstone; J. Rice; Gordon Fawcett; Brian Culshaw

doi:10.1117/12.190977

21 October 1994 Refractometry using resonance shifts in fiber to metal clad planar waveguide couplers

V. Kutsaenko, Walter Johnstone, J. Rice, Gordon Fawcett, Brian Culshaw

Proceedings Volume 2293, Chemical, Biochemical, and Environmental Fiber Sensors VI; (1994) https://doi.org/10.1117/12.190977
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Fiber to planar waveguide couplers have previously been investigated as rugged 'all fiber' refractometers. Here we report an investigation of the superstate index sensitivity of the resonant wavelengths for devices using readily fabricated polymer planar waveguide overlays with and without a thin metal layer (10 nm) coated onto the top surface of the polymer. For the metal coated structure the wavelength resonances associated with the TM polarization state demonstrated strong superstrate index sensitivity while the TE resonance positions were completely insensitive. Such a feature may be useful in terms of establishing a polarization referencing technique. In addition, an active device based on electro-optic polymer was realized and shown to be capable of providing a feedback mechanism for closed loop operation.

Citation Download Citation

V. Kutsaenko, Walter Johnstone, J. Rice, Gordon Fawcett, and Brian Culshaw "Refractometry using resonance shifts in fiber to metal clad planar waveguide couplers", Proc. SPIE 2293, Chemical, Biochemical, and Environmental Fiber Sensors VI, (21 October 1994); https://doi.org/10.1117/12.190977

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KEYWORDS

Polymers

Metals

Planar waveguides

Polarization

Overlay metrology

Electro optic polymers

Polymer multimode waveguides

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