Frequency analysis of lateral shear interferometers

Daniel Malacara-Hernandez; Manuel Servin Guirado

doi:10.1117/12.211882

14 June 1995 Frequency analysis of lateral shear interferometers

Daniel Malacara-Hernandez, Manuel Servin Guirado

Author Affiliations +

Proceedings Volume 2544, Interferometry VII: Techniques and Analysis; (1995) https://doi.org/10.1117/12.211882
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Lateral shear interferometers (LSI) are nowadays widely used for the analysis of optical wavefronts. These LSI are robust to vibration of the experimental set-up and of easy implementation. Application of these interferometers is large and well documented in the literature. The analysis of the interferograms produced by LSIs have been made using derivative approximations. These approximations are valid whenever the wavefront being analyzed is smooth and/or a small amount of shearing is used. In this work we present a frequency domain analysis for LSIs and we point out some of the errors that may arise using the standard analyzing techniques.

Citation Download Citation

Daniel Malacara-Hernandez and Manuel Servin Guirado "Frequency analysis of lateral shear interferometers", Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); https://doi.org/10.1117/12.211882

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