The Advanced X-ray Astrophysics Facility (AXAF) is to be an orbiting X-ray observatory with high resolution imaging capabilities. Specific goals of 0.5 arcsecond resolution, and an encircled energy of 60% within a 1.0 arcsecond diameter circle at 2.5 keV have been established for AXAF. Imaging X-ray optics are primarily limited by scattering of the X-rays from the mirror surfaces. To ensure that the AXAF goals can be met, comprehensive X-ray scattering measurements are being conducted on a large number of flat samples. Sub-arcsecond resolution is achieved in these measurements through use of the MSFC 1000 ft X-ray calibration facility and a high spatial resolution X-ray detector. Flats of various materials, various coatings, and a range of rms surface roughness are being evaluated. Direct evaluation of surface microroughness is also provided by a variety of optical and non-optical means. This paper describes the scattering measurement program, the instrumentation used to obtain the measurements and preliminary results of measurements on several of the sample flats.
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