Optoelectronic developments in speckle interferometry

Ralph P. Tatam

doi:10.1117/12.276306

17 July 1996 Optoelectronic developments in speckle interferometry

Ralph P. Tatam

Proceedings Volume 2860, Laser Interferometry VIII: Techniques and Analysis; (1996) https://doi.org/10.1117/12.276306
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

Speckle interferomeiry is now being used extensively in a range of engineering metrology applications. This paper reviews how developments in optoelectronic technology, such as solid state laser sources and optical fibre, have led to advances in the measurement capability of speckle interferometer systems. Examples are presented of surface profile, surface slope, static displacement and displacement gradient, and vibration measurement including heterodyning and stroboscopic techniques.

Citation Download Citation

Ralph P. Tatam "Optoelectronic developments in speckle interferometry", Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); https://doi.org/10.1117/12.276306

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