Paper
15 March 1998 Inspection tools for aerospace critical surfaces
Gary L. Workman, G. Wayne Thompson, Billy H. Nerren, H. Dewitt Burns Jr.
Author Affiliations +
Abstract
The measurement and control of cleanliness for critical surfaces during manufacturing and in service operations provides unique challenges in aerospace. For re-usable propulsion systems, such as the solid rocket motors, the current thrust for environmentally benign processes has had a major impact on programs designed for maintaining quality in the production of bondline surfaces. The major goal is to improve upon our ability to detect and identify possible contaminants which are detrimental to the integrity of the bondline. This effort requires an in-depth study of the possible sources of contamination, methodologies to detect and identify contaminants, discriminate between contaminants and chemical species caused by environmental conditions, and the effect of particular contaminants on the bondline integrity of the critical surfaces. This presentation will provide an overview of several optical methods used to detect and identify contamination on critical surfaces, currently being performed by the Surface Contamination and Analysis Team at Marshall Space Flight Center. The methods under development for contamination monitoring include FTIR and Near-IR SPectrometry, UV Fluorescence, and Variable Angle Spectroscopic Ellipsometry. Comparisons between these methods and the current primary tool, optical stimulation of electron emission for on-line inspection will be presented. Experiments include quantitative measurement of silicone and Conoco HD2 greases, metal hydroxides, tape residues, etc. on solid rocket motor surfaces.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gary L. Workman, G. Wayne Thompson, Billy H. Nerren, and H. Dewitt Burns Jr. "Inspection tools for aerospace critical surfaces", Proc. SPIE 3399, Process Control and Sensors for Manufacturing, (15 March 1998); https://doi.org/10.1117/12.302562
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near infrared

Aluminum

Contamination

Inspection

Silicon

Chemical analysis

Manufacturing

Back to Top