Total profile distortion Z-scan

Aristides Alfredo Marcano O.; A. Solis; E. Hernandez; Herve Maillotte

doi:10.1117/12.358370

6 July 1999 Total profile distortion Z-scan

Aristides Alfredo Marcano O., A. Solis, E. Hernandez, Herve Maillotte

Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999) https://doi.org/10.1117/12.358370
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia

Abstract

We propose a new method for the measurement of nonlinear susceptibility of an optical material based on the recording of the total distortions of the wave-front of a light wave propagating through the medium. We compare the method with the usual Z-scan and EZ-scan techniques and demonstrate theoretically and experimentally the better sensitivity of the new method.

Citation Download Citation

Aristides Alfredo Marcano O., A. Solis, E. Hernandez, and Herve Maillotte "Total profile distortion Z-scan", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); https://doi.org/10.1117/12.358370

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