Nonlinear features for product inspection

Ashit Talukder; David P. Casasent

doi:10.1117/12.341305

9 March 1999 Nonlinear features for product inspection

Ashit Talukder, David P. Casasent

Author Affiliations +

Proceedings Volume 3715, Optical Pattern Recognition X; (1999) https://doi.org/10.1117/12.341305
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

Classification of real-time X-ray images of randomly oriented touching pistachio nuts is discussed. The ultimate objective is the development of a system for automated non-invasive detection of defective product items on a conveyor belt. We discuss the extraction of new features that allow better discrimination between damaged and clean items (pistachio nuts). This feature extraction and classification stage is the new aspect of this paper; our new maximum representation and discriminating feature (MRDF) extraction method computes nonlinear features that are used as inputs to a new modified k nearest neighbor classifier. In this work, the MRDF is applied to standard features (rather than iconic data). The MRDF is robust to various probability distributions of the input class and is shown to provide good classification and new ROC (receiver operating characteristic) data.

Citation Download Citation

Ashit Talukder and David P. Casasent "Nonlinear features for product inspection", Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); https://doi.org/10.1117/12.341305

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