Multilayer optics for hard x-ray astronomy by means of replication techniques

Oberto Citterio; P. Cerutti; Francesco Mazzoleni; Giovanni Pareschi; Ennio Poretti; Paolo Lagana; A. Mengali; Carlo Misiano; Fabio Pozzilli; Enrico Simonetti

doi:10.1117/12.363644

29 September 1999 Multilayer optics for hard x-ray astronomy by means of replication techniques

Oberto Citterio, P. Cerutti, Francesco Mazzoleni, Giovanni Pareschi, Ennio Poretti, Paolo Lagana, A. Mengali, Carlo Misiano, Fabio Pozzilli, Enrico Simonetti

Author Affiliations +

Proceedings Volume 3766, X-Ray Optics, Instruments, and Missions II; (1999) https://doi.org/10.1117/12.363644
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

In this paper we will report on an activity undertaken with the aim of setting up a method for the realization of hard x-ray multilayer mirror astronomical optics based on a replication process. Our approach foresees the direct deposition of the multilayer stack on to the mandrel by ion-beam sputtering followed by the deposition of the Nickel by means of an electrolytic bath. The Nickel gives the mechanical strength to the mirrors. All deposited materials are later on separated from the mandrel by cooling it. This is a natural extension of the method already successfully used for the production of the soft x-ray optics with Au monolayer coating for the SAX, JET-X and XMM telescopes. This method is particularly convenient because permits not only of keeping the mirror supports very thin but also of achieving good imaging performances. Here we will present the main features of this method and the x-ray reflectivity and topographic results obtained from a first prototype flat sample we produced following this way.

Citation Download Citation

Oberto Citterio, P. Cerutti, Francesco Mazzoleni, Giovanni Pareschi, Ennio Poretti, Paolo Lagana, A. Mengali, Carlo Misiano, Fabio Pozzilli, and Enrico Simonetti "Multilayer optics for hard x-ray astronomy by means of replication techniques", Proc. SPIE 3766, X-Ray Optics, Instruments, and Missions II, (29 September 1999); https://doi.org/10.1117/12.363644

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