Position-sensitive ionization chamber for diffraction studies at synchrotron sources

Kazumichi Sato; Hidenori Toyokawa; Yoshiki Kohmura; Tetsuya Ishikawa; Masayo Suzuki

doi:10.1117/12.367117

6 October 1999 Position-sensitive ionization chamber for diffraction studies at synchrotron sources

Kazumichi Sato, Hidenori Toyokawa, Yoshiki Kohmura, Tetsuya Ishikawa, Masayo Suzuki

Proceedings Volume 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources; (1999) https://doi.org/10.1117/12.367117
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

A position-sensitive ionization chamber has been developed with backgammon-type-segmented electrodes. This novel detector possesses a linear range of 8 mm for determining the incident position of the X-ray beam incoming. The position resolution was found to be better than 10 micrometers , probably close the sub-micrometer region. Owing to its high spatial resolution, the position-sensitive ionization chamber was able to commit that the gradual decrease observed in the X-ray beam intensity at the BL44B2 of the SPring-8 facility was mainly due to the spatial variation of the X-ray beam position in time. The present work also confirmed the applicability of the novel detector to the feedback correction system for the beam stabilization.

Citation Download Citation

Kazumichi Sato, Hidenori Toyokawa, Yoshiki Kohmura, Tetsuya Ishikawa, and Masayo Suzuki "Position-sensitive ionization chamber for diffraction studies at synchrotron sources", Proc. SPIE 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, (6 October 1999); https://doi.org/10.1117/12.367117

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