Development of a dual-pulse fiber optic LIBS probe for in-situ elemental analyses

Kristine L. Eland; Dimitra N. Stratis; J. Chance Carter; S. Michael Angel

doi:10.1117/12.372865

21 December 1999 Development of a dual-pulse fiber optic LIBS probe for in-situ elemental analyses

Kristine L. Eland, Dimitra N. Stratis, J. Chance Carter, S. Michael Angel

Proceedings Volume 3853, Environmental Monitoring and Remediation Technologies II; (1999) https://doi.org/10.1117/12.372865
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

One of the strengths of laser-induced breakdown spectroscopy (LIBS) is the ability to acquire atomic emission spectra for a wide variety of samples non-invasively, with only optical access being required. The use of optical fibers makes the technique ideal for applications where the measurement area of interest is either not accessible or where it is not safe to take a sample. Fiber-optic LIBS probes have been described where a single laser pulse is delivered to the sampling region by one optical fiber and the emission is collected by another. One of the problems with this approach is fiber degradation from the high power laser pulses. To minimize this problem, we are investigating dual-pulse LIBS where the laser power is split between 2 different laser pulses that are separated by a short delay time. We have found in related studies that the use of dual laser pulses to obtain LIBS signals can lead to enhanced intensity and reproducibility for some types of samples. A natural extension of this result is to make dual- pulse measurements using optical fibers. Thus far, we have seen 1.5 to 2 fold enhancements for copper and lead using fiber-optics in various geometries to both deliver the dual laser pulses and collect the emission.

Citation Download Citation

Kristine L. Eland, Dimitra N. Stratis, J. Chance Carter, and S. Michael Angel "Development of a dual-pulse fiber optic LIBS probe for in-situ elemental analyses", Proc. SPIE 3853, Environmental Monitoring and Remediation Technologies II, (21 December 1999); https://doi.org/10.1117/12.372865

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