Examination of tungsten-oxide-based thin films for optical memory

Rebecca Bussjager; Joseph M. Osman; Joseph Chaiken; Mark A. Getbehead; Daniel S. Hinkel; Thomas McEwen

doi:10.1117/12.997628

28 June 1999 Examination of tungsten-oxide-based thin films for optical memory

Rebecca Bussjager, Joseph M. Osman, Joseph Chaiken, Mark A. Getbehead, Daniel S. Hinkel, Thomas McEwen

Proceedings Volume 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999; 386427 (1999) https://doi.org/10.1117/12.997628
Event: Optical Data Storage, 1999, Kauai, HI, United States

Abstract

Because of its well known electrochromic and photochromic properties, and its relative ease of large scale manufacture, tungsten oxide has long been a candidate for display applications. This use was first suggested by Deb in 1973, and numerous patents and papers in the primary literature followed. Tungsten oxide based electrochromic processes have been reviewed by Granquist. We are currently exploring the medium’s photochromic and electrochromic properties for memory and switching purposes. Photochromism refers to the fact that exposing the medium to light causes the material to change color. The light is thought to induce the formation of free charge carriers which can be mobile oxygen ions and radicals as well as electrons that initiate the chemistry leading to the color change. The process we have studied is represented by the chemical reaction below. This process is distinct from chemistry originally described by Deb and reviewed by Granquist in that subbandgap exploitation can be employed.

Citation Download Citation

Rebecca Bussjager, Joseph M. Osman, Joseph Chaiken, Mark A. Getbehead, Daniel S. Hinkel, and Thomas McEwen "Examination of tungsten-oxide-based thin films for optical memory", Proc. SPIE 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999, 386427 (28 June 1999); https://doi.org/10.1117/12.997628

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