Novel technique for characterizing integrated optical waveguides

Jefferson E. Odhner; Bipin K. Singh; Joung C. Ha

doi:10.1117/12.379936

24 March 2000 Novel technique for characterizing integrated optical waveguides

Jefferson E. Odhner, Bipin K. Singh, Joung C. Ha

Proceedings Volume 3936, Integrated Optics Devices IV; (2000) https://doi.org/10.1117/12.379936
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States

Abstract

A novel approach to characterizing integrated optical waveguides is described in which laser light illuminates the surface normal of the waveguide substrate and the transmitted light observed in the far field uniquely describes a number of physical characteristics of the waveguide. The proof of concept has been demonstrated with a HeNe laser on an ion diffused waveguide in silica glass but the technique is applicable to any integrated otpical waveguide. The advantages of this approach are that it is a great deal less expensive than conventional approaches using a Nemarski microscope or an EDAX attachment to an electron microscope and is very simple to set up. The small index variations that comprise a waveguide on a substrate are normally invisible . However, using this technique, when laser light is scanned across the waveguide, a unique pattern is seen in the far field that can be interpreted to not only determine the location of the waveguide, a unique pattern is seen in the far field that can be interpreted to not only determine the location of the waveguides but also certain physical characteristics about them.

Citation Download Citation

Jefferson E. Odhner, Bipin K. Singh, and Joung C. Ha "Novel technique for characterizing integrated optical waveguides", Proc. SPIE 3936, Integrated Optics Devices IV, (24 March 2000); https://doi.org/10.1117/12.379936

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