PROCEEDINGS VOLUME 3945
SYMPOSIUM ON INTEGRATED OPTOELECTRONICS | 20-26 JANUARY 2000
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Editor(s): Geoffrey T. Burnham, Xiaoguang He, Kurt J. Linden, S. C. Wang, S. C. Wang, Geoffrey T. Burnham
Editor Affiliations +
Geoffrey T. Burnham, Xiaoguang He, Kurt J. Linden, S. C. Wang, S. C. Wang, Geoffrey T. Burnham