PbTiO3-based multilayers: growth anomalies, x-ray analysis, and Raman spectroscopy

F. Le Marrec; R. Farhi; Daniel Ariosa; M. El Marssi; J.-L. Dellis; Michael G. Karkut

doi:10.1117/12.397847

6 September 2000 PbTiO₃-based multilayers: growth anomalies, x-ray analysis, and Raman spectroscopy

F. Le Marrec, R. Farhi, Daniel Ariosa, M. El Marssi, J.-L. Dellis, Michael G. Karkut

Author Affiliations +

Proceedings Volume 4058, Superconducting and Related Oxides: Physics and Nanoengineering IV; (2000) https://doi.org/10.1117/12.397847
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

We have used pulsed laser ablation to grow a series of PbTiO₃/BaTiO₃ (PTO/BTO) multilayers with a modulation wavelength (Lambda) that varies between 48 angstrom < (Lambda) < 360 angstrom. These samples were grown on MgO substrates buffered with 50 angstrom of SrTiO₃(STO). By modeling the x-ray diffraction patterns we have determined that the PTO layers are a-axis oriented and the BTO layers are c-axis oriented. This result is in contrast to individual thin films of PTO in which we find the c-axis to be perpendicular to the plane of the film, as well as with PTO/STO superlattices we have grown on the same buffered substrates. Raman spectroscopy reveals only PTO modes in the spectra of seven different PTO/BTO multilayers which, from symmetry arguments, is consistent with the x-ray model determination of a-PTO/c-BTO oriented superlattices. We also observe that the soft mode and the A₁(2TO) Raman line shift abruptly in frequency above (Lambda) equals 240 angstrom. We ascribe this to the possible strain relaxation in the multilayer, in which misfit dislocations appear at a critical wavelength (Lambda) _c. The E(2TO) line in the vicinity of 200 cm^-1 is (Lambda) dependent as well as symmetric and we have modeled it as a confined mode: a signature of the modulated structure.

Citation Download Citation

F. Le Marrec, R. Farhi, Daniel Ariosa, M. El Marssi, J.-L. Dellis, and Michael G. Karkut "PbTiO₃-based multilayers: growth anomalies, x-ray analysis, and Raman spectroscopy", Proc. SPIE 4058, Superconducting and Related Oxides: Physics and Nanoengineering IV, (6 September 2000); https://doi.org/10.1117/12.397847

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KEYWORDS

Multilayers

Superlattices

Raman spectroscopy

Crystals

X-rays

Thin films

X-ray diffraction

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