Infrared reflectivity study of Cu-doped PbTiO3 and PbZr0.52Ti0.48O3 ferroelectric thin films

Ruben K. Hovsepyan; E. A. Kafadaryan; Eduard S. Vardanyan; Stephan G. Grigoryan; Ruben S. Vardanyan; Alexander L. Manukyan

doi:10.1117/12.375286

28 December 1999 Infrared reflectivity study of Cu-doped PbTiO₃ and PbZr_0.52Ti_0.48O₃ ferroelectric thin films

Ruben K. Hovsepyan, E. A. Kafadaryan, Eduard S. Vardanyan, Stephan G. Grigoryan, Ruben S. Vardanyan, Alexander L. Manukyan

Author Affiliations +

Proceedings Volume 4060, New Trends in Atomic and Molecular Spectroscopy; (1999) https://doi.org/10.1117/12.375286
Event: New Trends in Atomic and Molecular Spectroscopy, 1999, none, Russian Federation

Abstract

Monocrystalline c-axis oriented thin films of PbTiO₃ with various hole concentration were prepared by Cu doping with 0.1, 0.5, 1.0 mas.% and substituting Zr for Ti (Zr:Ti equals 52:48). We report concentration-dependent far- and mid- infrared reflectivity spectra of these compounds focusing on the electronic properties. Optical functions (ε ₁, ε ₂, σ , -Im ε ^-1) have been analyzed by Kramers-Kronig transformation to reflectivity spectra measured in a frequency range of 200 - 10000 cm^-1 at room temperature. Conductivity spectra show a complete semiconducting dependence that can be analyzed by Drude-Lorentz model and in the terms of dynamic interaction, which leads to a frequency dependent scattering rate and enhanced low-frequency carrier mass 0.5 mas.% Cu in PbTiO₃ decreases effective mass from 3.5 to 1.5 near 200 cm^-1 and increases relaxation time as compared with the undoped sample.

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Ruben K. Hovsepyan, E. A. Kafadaryan, Eduard S. Vardanyan, Stephan G. Grigoryan, Ruben S. Vardanyan, and Alexander L. Manukyan "Infrared reflectivity study of Cu-doped PbTiO₃ and PbZr_0.52Ti_0.48O₃ ferroelectric thin films", Proc. SPIE 4060, New Trends in Atomic and Molecular Spectroscopy, (28 December 1999); https://doi.org/10.1117/12.375286

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