Modeling mark edge jitter in phase-change recording

Aparna C. Sheila; David N. Lambeth; Tuviah E. Schlesinger

doi:10.1117/12.399338

18 September 2000 Modeling mark edge jitter in phase-change recording

Aparna C. Sheila, David N. Lambeth, Tuviah E. Schlesinger

Author Affiliations +

Proceedings Volume 4090, Optical Data Storage 2000; (2000) https://doi.org/10.1117/12.399338
Event: Optical Data Storage, 2000, Whistler, BC, Canada

Abstract

In this paper, we develop a model for the statistical nature of nucleation in phase change recording media and use it to estimate the mark edge jitter arising from the nucleation process. We then investigate the dependence of mark edge jitter on the erase power and reflection layer thickness.

Citation Download Citation

Aparna C. Sheila, David N. Lambeth, and Tuviah E. Schlesinger "Modeling mark edge jitter in phase-change recording", Proc. SPIE 4090, Optical Data Storage 2000, (18 September 2000); https://doi.org/10.1117/12.399338

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE