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An energy dispersive XRF spectrometer equipped with a capillary lens having a spot size of 200 micrometers has been developed in the Institute of Roentgen Optics. A compact semiconductor Si-PIN detector with thermoelectric cooling is used to realize a portable instrument assembled in a carrying case. Some applications and examples of analyses are given.
Alexander S. Shcherbakov,Sergei M. Cheremisin,V. V. Danichev, andViktor S. Ozerov
"Focus-1 x-ray fluorescent spectrometer", Proc. SPIE 4155, Kumakhov Optics and Application, (8 June 2000); https://doi.org/10.1117/12.387869
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Alexander S. Shcherbakov, Sergei M. Cheremisin, V. V. Danichev, Viktor S. Ozerov, "Focus-1 x-ray fluorescent spectrometer," Proc. SPIE 4155, Kumakhov Optics and Application, (8 June 2000); https://doi.org/10.1117/12.387869