Multispectral inspection station detects defects on apples

James A. Throop; Daniel J. Aneshansley; Bill Anger

doi:10.1117/12.411737

29 December 2000 Multispectral inspection station detects defects on apples

James A. Throop, Daniel J. Aneshansley, Bill Anger

Proceedings Volume 4203, Biological Quality and Precision Agriculture II; (2000) https://doi.org/10.1117/12.411737
Event: Environmental and Industrial Sensing, 2000, Boston, MA, United States

Abstract

The performance of a multi-spectral apple inspection station capable of orienting some cultivars, conveying, and presenting apples to a camera at five apples per second is described. Apples are pre-sized and hand placed on the conveying devices to rotate about an axis passing through both the stem and calyx of each apple. An image of each apple is captured at four different wavelengths through a common aperture. Special optics and filters allow simultaneous image capture of apple reflectance for wavelength bands of 540 nm, 650 nm, 750 nm, and 950 nm, each with a bandwidth of approximately 60 nm. As each apple is conveyed laterally and rotated through the camera's field of view, 6 regions of interest representing most of the apple's surface at each wavelength band are captured. The images are processed to segment each defect from the surrounding undamaged tissue and the area of each defect is recorded. Typical defects such as new bruises, bruises on stored apples, scab, sooty blotch, corking, rot, russet, and insect damage are detected. Data is shown quantifying the ability of the inspection station to sort damaged apples into appropriate grades for correct pricing in the processing industry.

Citation Download Citation

James A. Throop, Daniel J. Aneshansley, and Bill Anger "Multispectral inspection station detects defects on apples", Proc. SPIE 4203, Biological Quality and Precision Agriculture II, (29 December 2000); https://doi.org/10.1117/12.411737

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