Parameter analysis of the photon counting technique for detecting fluorescent emission

Xinyang Lin; Tong Song

doi:10.1117/12.402616

9 October 2000 Parameter analysis of the photon counting technique for detecting fluorescent emission

Xinyang Lin, Tong Song

Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402616
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

This paper describes the basic idea of inspecting fluorescent material's emission characteristic with photon counting method, discusses the fundamental hardware configuration and working principle, proceeds the qualitative analysis of certain primary parameters of the detection system.

Citation Download Citation

Xinyang Lin and Tong Song "Parameter analysis of the photon counting technique for detecting fluorescent emission", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402616

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