Paper
10 October 2000 Measuring particulate concentration by means of scattered light scintillation
Anshi Chen, Jiming Hao, Zhongping Zhou, Yongliang Ma
Author Affiliations +
Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403873
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
A new method of measuring particulate concentration in flue gas is proposed. In the new method, the fluctuation of scattered light is used for calculating particulate mass concentration. Laboratory experiments show that the method can be applied to analyze the presence of dust particles in the flue gas stream. The benefits from the method are insensitivity to lens contamination and particle color change.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anshi Chen, Jiming Hao, Zhongping Zhou, and Yongliang Ma "Measuring particulate concentration by means of scattered light scintillation", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); https://doi.org/10.1117/12.403873
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Particles

Scintillation

Light scattering

Backscatter

Atmospheric particles

Contamination

Opacity

RELATED CONTENT

On-chip photonic particle sensor
Proceedings of SPIE (February 19 2018)
Particle monitor experiment
Proceedings of SPIE (December 18 1992)
Analysis of an in-situ fiber optic backscatter probe
Proceedings of SPIE (January 09 2002)
Contamination Effects On Optical Surfaces
Proceedings of SPIE (January 02 1990)

Back to Top