Paper
4 April 2001 Real-time inspection of metal laminates by means of CNNs
Victor M. Preciado, Domingo Guinea, Rodrigo Montufar-Chaveznava, Jose Vicente
Author Affiliations +
Proceedings Volume 4301, Machine Vision Applications in Industrial Inspection IX; (2001) https://doi.org/10.1117/12.420920
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
Analog CNN array computer arises as an alternative to traditional digital processors in many industrial inspection like visual quality control of metal laminants, capable of make in a single chip Tera equivalent operations per second. A 4096 analog CNN processor array is able to perform complex space-time image analysis, being much faster than a camera- computer system in continuous inspection applications. Both chips have been implemented in CMOS technology and they are managed by a 32-bit high-performance low-cost micro- controller that closes the pan, tilt, lighting, focus and zoom loops required in the implementation of the active vision strategies. Several convolution masks for the Cellular Processors has been selected to detect particular changes in the texture, size, direction or orientation of the image entities, reprogramming `on the fly' the pixel resolution of shape when necessary. Laboratory results present these Cellular Processors and multiple resolution imager circuits as a promising architecture for visual inspection of industrial processes in real time.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor M. Preciado, Domingo Guinea, Rodrigo Montufar-Chaveznava, and Jose Vicente "Real-time inspection of metal laminates by means of CNNs", Proc. SPIE 4301, Machine Vision Applications in Industrial Inspection IX, (4 April 2001); https://doi.org/10.1117/12.420920
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image processing

Inspection

Metals

Optical inspection

Analog electronics

Computer programming

Genetic algorithms

Back to Top