Paper
28 November 2000 Surface conductivity and bulk thermoelectric properties of thermoelements on the basis of extruded samples of Bi0.5Sb1.5Te3 and Bi2Te2.7Se0.3 solid solutions
G. Z. Bagiyeva, N. B. Mustafayev, D. Sh. Abdinov
Author Affiliations +
Proceedings Volume 4340, 16th International Conference on Photoelectronics and Night Vision Devices; (2000) https://doi.org/10.1117/12.407753
Event: XVI International Conference on Photoelectronics and Night Vision Devices, 2000, Moscow, Russian Federation
Abstract
Surface conductivity of the thermoelements on a basis of the extruded samples of Bi0.5Sb1.5Te3 and Bi2Te2.7Se0.3 solid solutions and influence of the distorted surface layer, arising at manufacturing thermoelements on their bulk thermoelectric properties have been investigated over 77-470 K temperature range. It is found that thermoelectrical efficiency of thermoelements after treatment of a surface increases by 10-20%. The obtained results are explained by creating of the distorted layer of approximately 20 micrometers thickness on a surface of thermoelements in the course of their manufacturing.
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G. Z. Bagiyeva, N. B. Mustafayev, and D. Sh. Abdinov "Surface conductivity and bulk thermoelectric properties of thermoelements on the basis of extruded samples of Bi0.5Sb1.5Te3 and Bi2Te2.7Se0.3 solid solutions", Proc. SPIE 4340, 16th International Conference on Photoelectronics and Night Vision Devices, (28 November 2000); https://doi.org/10.1117/12.407753
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KEYWORDS
Solids

Thermoelectric materials

Manufacturing

Temperature metrology

Crystals

Electrochemical etching

Tellurium

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