Paper
16 August 2001 Remote sensing through reduced Mueller matrix elements
Author Affiliations +
Abstract
Measurements of a reduced Mueller matrix in backscattering from diffusive, dielectric targets are reported as a function of the angle of incidence. It was found that the off-diagonal elements depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. A theoretical model that accounts for the non-trivial behavior in the off-diagonal elements of the Mueller matrix is presented. We comment on the applicability of this model to the determination of the shape of the targets.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeremy D. Ellis and Aristide C. Dogariu "Remote sensing through reduced Mueller matrix elements", Proc. SPIE 4380, Signal Processing, Sensor Fusion, and Target Recognition X, (16 August 2001); https://doi.org/10.1117/12.436979
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KEYWORDS
Scattering

Light scattering

Backscatter

Laser scattering

Polarization

Dielectrics

Remote sensing

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