Applications of x-ray intensity interferometry

Makina Yabashi; Kenji Tamasaku; Tetsuya Ishikawa

doi:10.1117/12.450979

24 December 2002 Applications of x-ray intensity interferometry

Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa

Proceedings Volume 4782, X-Ray Mirrors, Crystals, and Multilayers II; (2002) https://doi.org/10.1117/12.450979
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Intensity interferometry was applied for characterizing hard synchrotron radiation. Propagation of transverse coherence was evaluated by a couple of coincidence measurements, which have different source-to-image distances. Influences of phase object under several conditions were measured and discussed. X-ray pulse width was determined with high accuracy by scanning bandwidth of monochromator. Application to the next generation synchrotron sources was discussed.

Citation Download Citation

Makina Yabashi, Kenji Tamasaku, and Tetsuya Ishikawa "Applications of x-ray intensity interferometry", Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); https://doi.org/10.1117/12.450979

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