Paper
19 February 2003 ConoProbe and ConoLine, two new 3-dimensional measurement systems
Gabriel Y. Sirat, Freddy Paz, May Kleinman, Michael Doherty
Author Affiliations +
Proceedings Volume 4830, Third International Symposium on Laser Precision Microfabrication; (2003) https://doi.org/10.1117/12.486510
Event: LAMP 2002: International Congress on Laser Advanced Materials Processing, 2002, Osaka, Japan
Abstract
A new type of three-dimensional measurement systems based on Conoscopic Holography is steadily gaining ground against older techniques. ConoProbe, the point sensor is found today on many applications of Q.C. measurements, digitizing, reverse engineering and in-process inspection. Its precision and capacity to measure many materials and geometries previously poorly measured had convinced many OEM and integrators to switch to this new technology. The ConoLine, line sensor, is aimed mainly to in-line inspection and quality control. Distance measurement is used in some applications of high power lasers as for example for inspection before or after cutting or drilling. The ConoProbe is used for such an application with much benefit for the user. Indeed, one of the main advantages of the ConoProbe is its capacity to view through the lens of the high power laser, either YAG or CO2 and to measure accurately the distance using the laser’s own lens. The collinear geometry removes many artifacts related to triangulation probes. Moreover, by deporting the ConoProbe from the region of the laser lens, up to one or two meters, the user recovers much important space for integration purpose and reduces the need for protection of the ConoProbe.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gabriel Y. Sirat, Freddy Paz, May Kleinman, and Michael Doherty "ConoProbe and ConoLine, two new 3-dimensional measurement systems", Proc. SPIE 4830, Third International Symposium on Laser Precision Microfabrication, (19 February 2003); https://doi.org/10.1117/12.486510
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Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Holography

Calibration

Distance measurement

Inspection

Sensors

Head

Crystals

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