SIM white-light on-board processing algorithms

Mark H. Milman; Joseph Catanzarite

doi:10.1117/12.460853

26 February 2003 SIM white-light on-board processing algorithms

Mark H. Milman, Joseph Catanzarite

Proceedings Volume 4852, Interferometry in Space; (2003) https://doi.org/10.1117/12.460853
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

The Space Interferometry Mission (SIM) is a space-based long baseline optical interferometer designed to perform precision astrometry to an unprecedented accuracy. Highly accurate white light fringe estimation is an important enabling technology for the success of SIM. To accomplish this, the combined light from the two arms of the interferometer is sent through a prism so that fringes formed at different wavelengths are dispersed across a number of spectral channels. The relative optical path difference (OPD) between the two arms is modulated so that an estimate of the phase in each of the channels can be obtained using phase shifting interferometry (PSI) techniques. The present paper presents several of the difficulties encountered in white light fringe estimation for SIM, and offers a number of alternatives for mitigating them.

Citation Download Citation

Mark H. Milman and Joseph Catanzarite "SIM white-light on-board processing algorithms", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); https://doi.org/10.1117/12.460853

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
10 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Interferometers

Error analysis

Metrology

Ferroelectric materials

Modulation

Interferometry

Modulators

Show All Keywords

Keywords/Phrases

Search In:

Publication Years