Leakage of a guided mode caused by static and light-induced inhomogeneities in channel HTPE-LiNbO<sub>3</sub> waveguides

Sergey M. Kostritskii; Yuri N. Korkishko; Vyacheslav A. Fedorov; Alexander N. Alkaev; Vladmir S. Kritzak; Paul Moretti; Sorin Tascu; Bernard Jacquier

doi:10.1117/12.470323

3 April 2003 Leakage of a guided mode caused by static and light-induced inhomogeneities in channel HTPE-LiNbO₃ waveguides

Sergey M. Kostritskii, Yuri N. Korkishko, Vyacheslav A. Fedorov, Alexander N. Alkaev, Vladmir S. Kritzak, Paul Moretti, Sorin Tascu, Bernard Jacquier

Author Affiliations +

Proceedings Volume 4944, Integrated Optical Devices: Fabrication and Testing; (2003) https://doi.org/10.1117/12.470323
Event: Photonics Fabrication Europe, 2002, Bruges, Belgium

Abstract

In this paper, we report characterization of insertion losses, mode profiles and intensity distributions in channel LiNbO3 optical waveguide fabricated by High-Temperature Proton Exchange (HTPE). Optimal fabrication parameters were chosen in accordance with results obtained for test samples of a planar waveguide. A target wavelength of our optimization procedure was 810 - 840 nm, as fabrication of phase modulator used in sensor is developed. The guided mode intensity has been mapped by scanning near-field optical microscopy with a sub-wavelength resolution (<100 nm), simultaneously with observation of the topography of the scanned area (100 μm x 100 μm). These measurements offer important information about loss mechanisms in our waveguides.

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Sergey M. Kostritskii, Yuri N. Korkishko, Vyacheslav A. Fedorov, Alexander N. Alkaev, Vladmir S. Kritzak, Paul Moretti, Sorin Tascu, and Bernard Jacquier "Leakage of a guided mode caused by static and light-induced inhomogeneities in channel HTPE-LiNbO₃ waveguides", Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); https://doi.org/10.1117/12.470323

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