Combined shearography and speckle pattern photography for single-access multi-component surface strain measurement

Roger M. Groves; Shan Fu; Stephen W. James; Ralph P. Tatam

doi:10.1117/12.509780

29 April 2003 Combined shearography and speckle pattern photography for single-access multi-component surface

Roger M. Groves, Shan Fu, Stephen W. James, Ralph P. Tatam

Proceedings Volume 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002; (2003) https://doi.org/10.1117/12.509780
Event: Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, 2002, Beijing, China

Abstract

Full surface strain measurement requires the determination of two out-of-plane and four in-plane displacement gradient components of the surface strain tensor. Shearography is a full-field speckle interferometry technique with a sensitivity predominately to the out-of-plane displacenet gradient. Speckle pattern photography has the sensitivity to the in-plane displacement, and taking the derivative yields the in-plane dipslacment gradient. In this paper the two techniques are combined to yield a single-access multi-component surface strain measurement using shearography to measure the out-of-plane components and speckle pattern photography to measure the in-plane components. Results are presented of a multi-component surface strain measurement.

Citation Download Citation

Roger M. Groves, Shan Fu, Stephen W. James, and Ralph P. Tatam "Combined shearography and speckle pattern photography for single-access multi-component surface", Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); https://doi.org/10.1117/12.509780

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