Contrast sensitivity methods for acceptable limits of visual defects in CMOS sensors

Arnold W Yanof; Karen E. Jachimowicz

doi:10.1117/12.525756

7 June 2004 Contrast sensitivity methods for acceptable limits of visual defects in CMOS sensors

Arnold W Yanof, Karen E. Jachimowicz

Proceedings Volume 5301, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V; (2004) https://doi.org/10.1117/12.525756
Event: Electronic Imaging 2004, 2004, San Jose, California, United States

Abstract

This work characterizes three different types of sensor defects, and investigates the applicability of the Contrast Threshold Function (CTF) of the human visual system to the manufacturing test criteria for CMOS image sensors. The sensor defect types characterized are resist streaking, dye color spots, and orange-peel photodiode sensitivity noise. Algorithms are presented to objectively identify and rate the severity of each. Visual evaluations determined the subjective level of detectability and objectionability of each. The spatial frequency and modulation of the defects were measured, and compared with an appropriate CTF. The result is the minimum defect levels noticeable in test images can be almost order-of-magnitude higher than the known CTFs determined for the limits of human visual system sensitivity.

Citation Download Citation

Arnold W Yanof and Karen E. Jachimowicz "Contrast sensitivity methods for acceptable limits of visual defects in CMOS sensors", Proc. SPIE 5301, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V, (7 June 2004); https://doi.org/10.1117/12.525756

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