Analysis of problems in measurement of SiO2 nanoparticle by dynamic light scattering

Chengfeng Yue; Guangling Yang; Zhenjiang He; Leishou Yu; Li Peng

doi:10.1117/12.576543

9 February 2005 Analysis of problems in measurement of SiO₂ nanoparticle by dynamic light scattering

Chengfeng Yue, Guangling Yang, Zhenjiang He, Leishou Yu, Li Peng

Author Affiliations +

Proceedings Volume 5635, Nanophotonics, Nanostructure, and Nanometrology; (2005) https://doi.org/10.1117/12.576543
Event: Photonics Asia, 2004, Beijing, China

Abstract

Based on the analysis of Dynamic Light Scattering(DLS) technique, and toke the measurement of SiO₂ particle (size from 200nm-1300nm) using BI-200SM Goniometer as an example, this paper discussed the factors and the effects brought by these factors on measurement result. The analyzed factors include: poly of particles, inversion algorithm, irradiate time of laser on particles, surrounding temperature and the kind of liquid. Some phenomena was observed, such as: the difference among results by different algorithms changed with the change of particles' poly, the measurement result increased slightly as time went on, the size of particles increased greatly as the temperature was increased, the scattering light intensity was been depressed badly and the liquid with particles appeared unusually transparent and clean when SiO₂ particles were put into ethanol.

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Chengfeng Yue, Guangling Yang, Zhenjiang He, Leishou Yu, and Li Peng "Analysis of problems in measurement of SiO₂ nanoparticle by dynamic light scattering", Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); https://doi.org/10.1117/12.576543

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