An extreme ultraviolet spectrometer

Leonid V. Didkovsky; Darrell L. Judge; Andrew R. Jones

doi:10.1117/12.588001

7 March 2005 An extreme ultraviolet spectrometer

Leonid V. Didkovsky, Darrell L. Judge, Andrew R. Jones

Proceedings Volume 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI; (2005) https://doi.org/10.1117/12.588001
Event: Electronic Imaging 2005, 2005, San Jose, California, United States

Abstract

A concept and preliminary design of an Extreme Ultraviolet (EUV) spectrometer is presented. The spectrometer is based on a gas ionization chamber and an advanced eight-electrode electron focusing system to form a narrow electron beam on a photodiode aperture. The design is modeled with the SIMulation of IONs (SIMION) tools and shows the ability to scan through the spectral range of 20.0 - 40.6 nm by changing the potential on a single control electrode between about 200 and 1100 V. The spectral resolution is about 0.25 nm in the middle of the band. The set of the focusing potentials may be changed to allow detection of solar EUV radiation in a wider spectral band, e.g. 5.0 - 50.0 nm. The potentials may be also optimized to improve the spectral resolution in a required spectral window.

Citation Download Citation

Leonid V. Didkovsky, Darrell L. Judge, and Andrew R. Jones "An extreme ultraviolet spectrometer", Proc. SPIE 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI, (7 March 2005); https://doi.org/10.1117/12.588001

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