Paper
13 June 2005 High-accuracy profile form measurement by a scanning system consisting of an angle sensor and coupled distance sensors
Joachim Gerhardt, Ralf Geckeler, Michael Schulz, Clemens Elster
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Abstract
A scanning system consisting of an angle sensor and coupled distance sensors is used for high-accuracy profile form measurements of optical surfaces. This system allows both scanning stage errors and systematic errors of the distance sensors to be estimated. Additionally, a high lateral resolution is achieved. The optical surface profile is reconstructed from the measurements made by the angle and distance sensors by application of least-squares. A test set-up is presented and the results of optical form measurements are shown.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joachim Gerhardt, Ralf Geckeler, Michael Schulz, and Clemens Elster "High-accuracy profile form measurement by a scanning system consisting of an angle sensor and coupled distance sensors", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612492
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CITATIONS
Cited by 3 scholarly publications and 1 patent.
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KEYWORDS
Sensors

Distance measurement

Interferometers

Error analysis

Autocollimators

Calibration

Optical scanning systems

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