Paper
5 October 2005 Genetic algorithm design of reflection thin-film coatings and polarization devices
A. R. M. Zaghloul, Y. A. Zaghloul
Author Affiliations +
Abstract
In this communication, the design of reflection thin-film coatings and polarization-devices is achieved by the use of a recently developed fast genetic algorithm (GA). The reflection thin-film coatings, and polarization-devices, are both treated as film-substrate systems. With the required polarization-characteristics of the device as an input, the GA provides any, or all, of the design parameters at which the coating, or device, behaves as prescribed at the wavelength of operation; film and substrate materials, film thickness, and angle of incidence. The GA is real fast. It is modified to provide the required design parameters within a few cycles, literally in no time. The accuracy of the GA is high, and the GA itself is robust and consistent.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. R. M. Zaghloul and Y. A. Zaghloul "Genetic algorithm design of reflection thin-film coatings and polarization devices", Proc. SPIE 5963, Advances in Optical Thin Films II, 59632E (5 October 2005); https://doi.org/10.1117/12.627432
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Cited by 1 scholarly publication.
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KEYWORDS
Polarization

Reflection

Thin film coatings

Genetic algorithms

Thin films

Polarizers

Thin film devices

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