Paper
7 December 2006 The soft x-ray beamline at Frascati Labs
Gianfelice Cinque, Emilio Burattini, Antonio Grilli, Sultan Dabagov
Author Affiliations +
Proceedings Volume 5974, International Conference on Charged and Neutral Particles Channeling Phenomena; 59741B (2006) https://doi.org/10.1117/12.640114
Event: International Conference on Charged and Neutral Particles Channeling Phenomena, 2004, Rome, Italy
Abstract
DAΦNE-Light is the Synchrotron Radiation laboratory at the Laboratori Nazionali di Frascati (LNF)1. Three beamlines were commissioned since spring 2003 to exploit parasitically the intense photon emission from DAΦNE, the 0.5 1 GeV storage ring routinely circulating over 1 A of electrons. The soft X-ray beamline utilizes a wiggler source and, by a double-crystal fixed-exit monochromator, it is operational in the distinguishing energy window 1.5 - 4 keV range to be extended from the "water window" toward 6 keV. At present, the research activity is focused on X-ray Absorption Spectroscopy (XAS): precisely, X-ray Absorption Near Edge Spectroscopy (XANES) on the inner electronic levels of light elements and transition metals from Al to Ge and both d- and f-shells of higher Z atoms. Preliminary tests of X-ray imaging have been performed in view of applying different focusing optics, namely policapillary systems in trasmission and/or bent mica diffractor in back-reflection, for X-ray microscopy and spectromicroscopy experiments. The use of polycapillary systems (lenses, halflenses, capillaries) for studying features of radiation transportation by such structures (X-ray channelling, focusing, bending, etc.) has been planned.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gianfelice Cinque, Emilio Burattini, Antonio Grilli, and Sultan Dabagov "The soft x-ray beamline at Frascati Labs", Proc. SPIE 5974, International Conference on Charged and Neutral Particles Channeling Phenomena, 59741B (7 December 2006); https://doi.org/10.1117/12.640114
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KEYWORDS
X-rays

Electrons

Potassium

Absorption spectroscopy

Silicon

Crystals

Mica

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