Multi-wavelength holographic profilometry

E. A. Barbosa; M. R. Gesualdi; M. Muramatsu

doi:10.1117/12.668293

20 January 2006 Multi-wavelength holographic profilometry

E. A. Barbosa, M. R. Gesualdi, M. Muramatsu

Proceedings Volume 6027, ICO20: Optical Information Processing; 60272L (2006) https://doi.org/10.1117/12.668293
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China

Abstract

A novel method for surface profilometry by holography is presented. We used a diode laser emitting at many wavelengths simultaneously as the light source and a Bi₁₂TiO₂₀ (BTO) crystal as the holographic medium in single exposure processes. The employ of multi-wavelength, large free spectral range (FSR) lasers leads to holographic images covered of interference fringes corresponding to the contour lines of the studied surface. In order to obtain the relief of the studied surface, the fringe analysis was performed by the phase stepping technique (PST) and the phase unwrapping was carried out by the Cellular-automata method. We analysed the relief of a tilted flat metallic bar and a tooth prosthesis.

Citation Download Citation

E. A. Barbosa, M. R. Gesualdi, and M. Muramatsu "Multi-wavelength holographic profilometry", Proc. SPIE 6027, ICO20: Optical Information Processing, 60272L (20 January 2006); https://doi.org/10.1117/12.668293

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