Paper
17 May 2006 MOVPE growth of QWIP detectors using tBAs as an alternative arsenic precursor
Carl Asplund, Hedda Malm, Henk Martijn
Author Affiliations +
Abstract
The use of arsine in metal-organic vapor phase epitaxy (MOVPE) growth is well established in the compound semiconductor industry but associated with large potential risks due to its high toxicity. Worldwide efforts are therefore being made to replace it with less hazardous source materials. Acreo, a commercial supplier of quantum well infrared photodetector (QWIP) focal plane arrays (FPA), is working towards an MOVPE process where tertiarybutylarsine (tBAs) instead of arsine is used in the growth of AlGaAs/GaAs n-type QWIP epiwafers. In this paper we investigate the performance of QWIP FPA produced from conventional arsine and alternative tBAs arsenic precursors. We also discuss the two growth processes regarding uniformity, crystalline purity and production cost. The performance of our QWIP structures grown using tBAs and arsine is comparable in terms of response and response-to-the dark current ratio.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carl Asplund, Hedda Malm, and Henk Martijn "MOVPE growth of QWIP detectors using tBAs as an alternative arsenic precursor", Proc. SPIE 6206, Infrared Technology and Applications XXXII, 62060F (17 May 2006); https://doi.org/10.1117/12.668358
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Quantum well infrared photodetectors

Silicon

Doping

Carbon

Staring arrays

Arsenic

Sensors

RELATED CONTENT

Development of a 1Kx1K GaAs QWIP far IR imaging array
Proceedings of SPIE (January 12 2004)
Recent advances of QWIP development in Sweden
Proceedings of SPIE (May 14 2007)
Advantages of quantum cascade detectors
Proceedings of SPIE (February 12 2008)
C-QWIP focal plane array sensitivity
Proceedings of SPIE (May 06 2009)

Back to Top