Near-field microwave diagnostics with nonlinear-optical sensors

John F. Whitaker; Kyoung Yang; Chia-Chu Chen

doi:10.1117/12.707781

8 February 2007 Near-field microwave diagnostics with nonlinear-optical sensors

John F. Whitaker, Kyoung Yang, Chia-Chu Chen

Proceedings Volume 6471, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV; 64710U (2007) https://doi.org/10.1117/12.707781
Event: Integrated Optoelectronic Devices 2007, 2007, San Jose, California, United States

Abstract

The concept and implementation of a near-field microwave measurement system that relies on the Pockels effect in fiber-coupled, semi-insulating GaAs probes to acquire polarization-sensitive maps of electric-field patterns in close proximity to antenna arrays, integrated circuits, and packaged components, is presented. The evolution of the electro-optic field-mapping technique, which has subsequently addressed magnetic-field characterization via magneto-optic sensing and temperature measurement through semiconductor band-gap modulation, will also be discussed. The use of emerging materials, such as diluted magnetic semiconductors, is also considered.

Citation Download Citation

John F. Whitaker, Kyoung Yang, and Chia-Chu Chen "Near-field microwave diagnostics with nonlinear-optical sensors", Proc. SPIE 6471, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV, 64710U (8 February 2007); https://doi.org/10.1117/12.707781

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